The University of Maryland MRSEC grants ended in September 2013 after 17 years of successful operation. This site remains as a history of the center, but will not be actively maintained.

Shared Experimental Facilities (SEF)

Scanning Electron Microscopy/Scanning Tunneling Microscopy/Atomic Force Microscopy Facility

Overview:

SEM

Inside the SEM

This facility integrates a scanning electron microscope, atomic force microscope, and scanning tunneling microscope in one state-of-the-art instrument for multi scale imaging of conducting and non conducting samples. The sample stage permits electronic device imaging under operational conditions.

Instrument Designation:

Key Specifications:

Contact:

Dr. Bill Cullen

MRSEC SPM Facilities Manager

wcullen@umd.edu

(301) 405-0076

Contact Us | Page Last Updated: 05/01/09 | Site Map