Shared Experimental Facilities (SEF):

Electron Microscopy Facility (NISP Lab)

The Electron Microscopy Facility is known as the Nanoscale Imaging Spectroscopy and Properties Lab (NISP Lab). This Facility houses two transmission electron microscopes (TEMs), a field emission scanning electron microscope (SEM), an environmental SEM, and an electron microprobe. The flagship instrument is a JEOL-2100F field emission TEM with a point resolution of 0.19 nm. This microscope is capable of elemental analysis (qualitative, quantitative as well as mapping) using the attached energy-dispersive x-ray spectrometer (EDS) or using the attached EELS spectral camera. The lab also houses a JEOL-2100 thermionic TEM with Lorentz imaging and in-situ capabilities (including specimen heating and cooling). The Hitachi SU-70 field-emission SEM has a high-intensity small probe size suitable for fast high-resolution imaging (resolution 1 nm) and also high-speed chemical mapping using the attached EDS system.

This facility is supported as a MRSEC Shared Experimental Facility in cooperation with the NanoCenter at the University of Maryland.

Contact

Wen-An Chiou

wachiou@umd.edu

Or see the NISP Lab website for more information.