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Shared Experimental Facilities (SEF):Variable Temperature UHV Scanning Tunneling MicroscopeSuper-user: W. Cullen Supervisors: Professor J. Reutt-Robey 
An ultrahigh vacuum scanning tunneling microscopy system with in situ surface preparation and analytical facilities has been developed. This system is based upon an Omicron Associates VT-UHV-STM, permitting STM measurements over a broad thermal range (25K - 1400K) on metals, semiconductors, and other conducting thin film surfaces. To make this a more powerful user facility, we have recently implemented a sample/tip load-lock and facilities for in situ sample preparation and chemical deposition. These facilities include a fine focus ion source, metal evaporation sources and thin film monitors, and a liquid doser. A Sun SPARC workstation is dedicated to this system, permitting efficient collection, analysis, and transfer of STM images. This facility is available for collaborative research projects with the MRSEC investigators. ContactDr. Janice Reutt-Robey MRSEC SEF Coordinator and Associate Professor (301) 405-1807 |
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© (2005) University of Maryland, College Park. All rights reserved. Permission to redistribute the contents without alteration is granted to educational institutions for non-profit administrative or educational purposes if proper credit is given to the University of Maryland, College Park as the source.
This material is based upon work supported by the National Science Foundation under the Materials Research Science and Engineering Centers program. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.