Shared Experimental Facilities (SEF)

Variable Temperature UHV Scanning Tunneling Microscope

Overview:

This microscope provides atomically-resolved topographic images of crystalline surfaces, films, and supported nanostructures. Maps of the surface electronic structure are obtained via spatially-resolved Scanning Tunneling Spectroscopy.

Instrument Designation:

• Omicron Nanotechnology UHV-VT-STM
• Nanonis SPM Controller

Key Specifications:

• Conducting Samples
• 25 K - 1500 K temperature window
• 25 pa - 50 nA STM and STS
• 10 µ scanner
• 6 mm coarse positioning
• in situ sample processing - sputtering/thermal/deposition
• rapid-entry loadlock to 10^-10 torr SPM chamber

Contact:

Dr. Bill Cullen

MRSEC SPM Facilities Manager

wcullen@umd.edu

(301) 405-0076