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Shared Experimental Facilities (SEF):Small Spot Xray Photoelectron SpectrometerSuper-user: Karen Gaskell Supervisors: Professor Janice Reutt-Robey 
This high sensitivity XPS (Kratos Axis 165) is available for compositional and chemical state analysis of monolayers, thin films, and solid state materials. The system is presently configured with both dual anode(Mg, AlKa) and monochromatized (AlKa) Xray sources. The system has been configured for broad materials applications with the presence of a variable temperature sample stage, charge neutralization system (for insulating samples), ion gun (for depth profiling), and a rapid entry loadlock for high throughput analysis. [Additional Information...] This facility is operated cooperatively with the Department of Chemistry & Biochemistry. ContactKaren Gaskell (301) 405-4999 |
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This material is based upon work supported by the National Science Foundation under the Materials Research Science and Engineering Centers program. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.