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Lab Tours: SPM/STM/AFM/SEMThe tour of the scanning probe microscopy laboratory emphasizes how scanned probe measurements have revolutionized the field of surface science and enabled the newly developing field of nanoscience. The tour will feature two key instruments: a variable temperature scanning tunneling microscope and a unique instrument which combines scanning tunneling / atomic force microscopy with scanning electron microscopy, providing the ultimate dynamic range in imaging - from millimeter to nanometer scale. Discussion includes: (1) basic mechanisms of imaging in scanning tunneling microscopy and atomic force microscopy, explaining similarities and differences between the two methods, (2) the rationale behind performing SPM experiments in ultra-high vacuum, and (3) highlights of experiments within the UMD MRSEC that rely exclusively on these instruments. |
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© (2005) University of Maryland, College Park. All rights reserved. Permission to redistribute the contents without alteration is granted to educational institutions for non-profit administrative or educational purposes if proper credit is given to the University of Maryland, College Park as the source.
This material is based upon work supported by the National Science Foundation under the Materials Research Science and Engineering Centers program. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.