The University of Maryland MRSEC grants ended in September 2013 after 17 years of successful operation. This site remains as a history of the center, but will not be actively maintained.
University of Maryland
Materials Research Science and Engineering Center
Shared Experimental Facilities (SEF)
Scanning Electron Microscopy/Scanning Tunneling Microscopy/Atomic Force Microscopy Facility
Overview:
This facility integrates a scanning electron microscope, atomic force microscope, and scanning tunneling microscope in one state-of-the-art instrument for multi scale imaging of conducting and non conducting samples. The sample stage permits electronic device imaging under operational conditions.
Instrument Designation:
- JEOL JSPM-4500A
- Nanonis SPM Controller with OC4 Oscillator Control
Key Specifications:
- Image Modes - STM, STS, MFM, EFM, SKPM, contact- and non-contact AFM
- Three Sample Contacts
- 0.1 nm - 5 µ imaging
- 25 K - 800 K temperature window
- 25 pa - 50 nA STM and STS
- in situ sample processing - sputtering/thermal/deposition
- rapid-entry loadlock to 10-10 torr SPM chamber
Contact:
Dr. Bill Cullen
MRSEC SPM Facilities Manager
(301) 405-0076
Contact Us | Page Last Updated: 05/01/09 | Site Map
